2009/12/31 by Wolfgang Schnitzler, Georg Jacob, Robert Fickler +3
Chemistry · Engineering · Physics and Astronomy · #Atomic physics #Beam (structure) #Beam divergence #Chromatic aberration #Chromatic scale #Electrostatic lens #Focused ion beam #Integrated Circuits and Semiconductor Failure Analysis #Ion #Ion beam #Ion gun #Ion source #Ion trap #Ion-surface interactions and analysis #Laser #Laser beam quality #Laser beams #Lens (geology) #Mass Spectrometry Techniques and Applications #Optics #Physics #Quantum mechanics #RADIUS #physics.ins-det #quant-ph
paper · pdf · doi:10.1088/1367-2630/12/6/065023
published as New J.Phys.12:065023,2010 · 16 pages, 7 figures
arxiv created 2010/02/03 · openalex publication_date 2010/06/28 · arxiv updated 2014/11/20 · openalex created_date 2025/10/10 · openalex updated_date 2026/08/05
We focus down an ion beam consisting of single 40 Ca + ions to a spot size of a few micrometers using an einzel lens. Starting from a segmented linear Paul trap, we have implemented a procedure that allows us to deterministically load a predetermined number of ions by using the potential shaping capabilities of our segmented ion trap. For single-ion loading, an efficiency of 96.7(7)% has been achieved. These ions are then deterministically extracted out of the trap and focused down to a 1σ-spot radius of (4.6±1.3) μm at a distance of 257 mm from the trap center. Compared to previous measurements without ion optics, the einzel lens is focusing down the single-ion beam by a factor of 12. Due to the small beam divergence and narrow velocity distribution of our ion source, chromatic and spherical aberration at the einzel lens is vastly reduced, presenting a promising starting point for focusing single ions on their way to a substrate.