Atom Probe Tomography 2012

2012/06/22 by Thomas F. Kelly, David J. Larson · 2 citations
Engineering · Materials Science · #Advanced Materials Characterization Techniques #Diamond and Carbon-based Materials Research #Ion-surface interactions and analysis

paper · doi:10.1146/annurev-matsci-070511-155007

openalex publication_date 2012/06/22 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Abstract

In the world of tomographic imaging, atom probe tomography (APT) occupies the high-spatial-resolution end of the spectrum. It is highly complementary to electron tomography and is applicable to a wide range of materials. The current state of APT is reviewed. Emphasis is placed on applications and data analysis as they apply to many fields of research and development including metals, semiconductors, ceramics, and organic materials. We also provide a brief review of the history and the instrumentation associated with APT and an assessment of the existing challenges in the field.

Citations

• The 10 cm Atom Probe
• Nanoscale chemical tomography of buried organic–inorganic interfaces in the chiton tooth
• The Atom-Probe Field Ion Microscope

Cited by

• A nexus between 3D atomistic data hybrids derived from atom probe microscopy and computational materials science: A new analysis of solute clustering in Al-alloys
• Atom probe [wikipedia]

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