1973/08/01 by J. A. Panitz · 4 citations
Engineering · Materials Science · #Advanced Materials Characterization Techniques #Hydrogen embrittlement and corrosion behaviors in metals #Ion-surface interactions and analysis
paper · doi:10.1063/1.1686295
openalex publication_date 1973/08/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/05/21
A novel atom probe is described which can determine the mass-to-charge ratios of all ion species produced during a single desorption event or of individual species at several preselected crystallographic locations during each desorption event. This is accomplished without tip movement in an instrument no larger than a conventional field ion microscope by using a new channel plate photomultiplier detector. Alignment, aiming, and pulse stability problems common to all previous designs have been eliminated. Although the present mass resolution is 4 amu at m/n = 184/3, single isotope resolution, if desired, seems possible.