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Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadening

1982/06/01 by Th. H. de Keijser, J. I. Langford, E. J. Mittemeijer +1 · 27 citations
Engineering · Materials Science · #Microstructure and Mechanical Properties of Steels #X-ray Diffraction in Crystallography #Metal and Thin Film Mechanics

paper · doi:10.1107/s0021889882012035

Abstract

The use of the Voigt function for the analysis of the integral breadths of broadened X-ray diffraction line profiles forms the basis of a rapid and powerful single-line method of crystallite-size and strain determination which is easy to apply. To avoid graphical methods or interpolation from tables, empirical formulae of high accuracy are used and an estimation of errors is presented, including the influence of line-profile asymmetry. The method is applied to four practical cases of size-strain broadening: (i) cold-worked nickel, (ii) a nitrided steel, (iii) an electrodeposited nickel layer and (iv) a liquid-quenched AlSi alloy.

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