1981/08/01 by Anthony J. Devaney · 7 citations
Physics and Astronomy · Engineering · #Digital Holography and Microscopy #Advanced X-ray Imaging Techniques #Near-Field Optical Microscopy
paper · doi:10.1364/ol.6.000374
openalex publication_date 1981/08/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/29
A method for determining the internal structure of a localized scattering potential from field measurements performed outside the scattering volume is developed by using the Rytov approximation. The theory is compared with the inverse-scattering method within the Born and eikonal approximations and found to reduce to these methods in the weak-scattering (Born) and very-short-wavelength (eikonal) limits.