Modeling single- and multiple-electron resonances for electric-field-sensitive scanning probes

2008/06/11 by S. H. Tessmer, S H Tessmer, I. Kuljanishvili +1
Biochemistry, Genetics and Molecular Biology · Engineering · Physics and Astronomy · #Advanced Electron Microscopy Techniques and Applications #Computer simulation #Electron Spin Resonance Studies #Electrostatic interaction #Electrostatics #Near-Field Optical Microscopy #Resonance (particle physics) #Scanning probe microscopy #cond-mat.mes-hall #cond-mat.str-el

paper · pdf · doi:10.1088/0957-4484/19/44/445503

published as Nanotechnology 19 (2008) 445503. · 10 pages, 4 figures

arxiv created 2008/06/11 · openalex publication_date 2008/10/02 · arxiv updated 2009/12/01 · openalex created_date 2016/06/24 · openalex updated_date 2026/08/05

Abstract

We have developed a modeling method suitable for analyzing single- and multiple-electron resonances detected by electric-field-sensitive scanning probe techniques. The method is based on basic electrostatics and a numerical boundary-element approach. The results compare well to approximate analytical expressions and experimental data.

Citations

• Subsurface charge accumulation imaging of a quantum Hall liquid
• Imaging magnetic focusing of coherent electron waves
• The Chemical Potential
• Charge-based quantum computing using single donors in semiconductors