2003/04/30 by Michael S. Pierce, Rob G. Moore, R. G. Moore +7 · 1 citation
Engineering · Physics and Astronomy · #Characterization and Applications of Magnetic Nanoparticles #Magnetic properties of thin films #Theoretical and Computational Physics #cond-mat.mtrl-sci #cond-mat.other
paper · pdf · doi:10.1103/physrevlett.90.175502
published as Physical Review Letters 90, 175502 (2003) · 5 pages, 4 figures
openalex publication_date 2003/04/30 · arxiv created 2004/11/28 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
We have used coherent, resonant, x-ray magnetic speckle patterns to measure the statistical evolution of the microscopic magnetic domains in perpendicular magnetic films as a function of the applied magnetic field. Our work constitutes the first direct, ensemble-averaged study of microscopic magnetic return-point memory, and demonstrates the profound impact of interfacial roughness on this phenomenon. At low fields, the microscopic magnetic domains forget their past history with an exponential field dependence.