2010/11/01 by Naohisa Happo, Kouichi Hayashi, Shinya Hosokawa
Physics and Astronomy · Biochemistry, Genetics and Molecular Biology · #Crystallography and Radiation Phenomena #Advanced X-ray Imaging Techniques #Advanced Electron Microscopy Techniques and Applications
paper · doi:10.1143/jjap.49.116601
X-ray fluorescence holography (XFH) is a powerful technique for determining three-dimensional local atomic arrangements around a specific fluorescing element. However, the raw experimental hologram is predominantly a mixed hologram, i.e., a mixture of hologram generated in both normal and inverse modes, which produces unreliable atomic images. In this paper, we propose a practical subtraction method of the normal component from the inverse XFH data by a Fourier transform for the calculated hologram of a model ZnTe cluster. Many spots originating from the normal components could be properly removed using a mask function, and clear atomic images were reconstructed at adequate positions of the model cluster. This method was successtully applied to the analysis of experimental ZnTe single crystal XFH data.