2019/10/29 by Shinya Hosokawa, Naohisa Happo, Tomohiro Matsushita +3
Physics and Astronomy · #Crystallography and Radiation Phenomena #Advanced X-ray Imaging Techniques #Photorefractive and Nonlinear Optics
paper · doi:10.7567/1347-4065/ab5258
Abstract X-ray fluorescence holography (XFH) can be used to conduct atom-resolved structural characterization of materials around a specific element, and has been applied to various functional materials. Recently, a valence-selective function has been found by this technique by employing incident X-ray energies near an absorption edge of a specified element. In this article, the principle and experimental procedure of a valence-selective XFH and subsequent data analysis procedure using the sparse modeling approach of L 1 regression are introduced. Then, the excellent XFH results with valence-selective studies are reviewed, such as Y oxide thin film, YbInCu 4 valence transition material, and Fe 3 O 4 mixed valence material.