2010/04/01 by Hao Lei, Y. Hoshi, Yoichi Hoshi +4
Engineering · Materials Science · #Organic Light-Emitting Diodes Research #Organic Electronics and Photovoltaics #Conducting polymers and applications
paper · doi:10.1143/jjap.49.042103
Damage to an aluminum(III) bis(2-methyl-8-quinolinato)-4-phenylphenolate (BAlq) organic film by direct electron irradiation was investigated. An electron-bombardment system, which can supply a desired amount and energy of electrons, was set up. Changes in the photoluminescence (PL) intensity of the BAlq layer were used to evaluate the damage produced by electron bombardment. A marked reduction of the PL intensity was observed with the increase in the amount and energy of electrons irradiated to the BAlq films, although no changes in the Fourier transform infrared (FTIR) spectra of the BAlq layer due to electron bombardment were detected. A change in surface morphology, however, was observed by atomic force microscopy (AFM). These results suggest that electron bombardment induces significant damage to the organic layer and that a reduction of electron bombardment during the sputter deposition of electrode films is necessary to improve the performance of the organic layer.