Damage-limited resolution for X-ray and electron microscopy of organic specimens

2026/03/24 by Ray Egerton, Colin Nave · 1 voice
Physics and Astronomy · Biochemistry, Genetics and Molecular Biology · Materials Science · #Advanced X-ray Imaging Techniques #Advanced Electron Microscopy Techniques and Applications #Electron and X-Ray Spectroscopy Techniques

paper · doi:10.1107/s2059798326002445

openalex publication_date 2026/03/24 · openalex created_date 2026/04/11 · openalex updated_date 2026/07/23

Abstract

Analytical expressions for the damage-limited resolution (DLR) are developed and applied to X-ray and electron imaging of beam-sensitive specimens, allowing for variation of the characteristic radiation dose with spatial resolution. The dependence of DLR on specimen thickness is illustrated for the common modes of X-ray and transmission electron-microscope imaging. Similarities and differences between the radiolysis damage caused by electrons and X-rays are discussed. The meaning of a `Bragg boost' in diffracted intensity is discussed.

Discussions

• The connection between beam damage and image resolution in X-ray and electron microscopy is investigated and the characteristics of electron and X-ray radiolysis are compared to obtain insight into th [bsky, 2 points, 0 comments]

Related

• Mechanisms of radiation damage in beam‐sensitive specimens, for TEM accelerating voltages between 10 and 300 kV
• Electrons and X-rays for diffraction and imaging
• The energy dependence of contrast and damage in electron cryomicroscopy of biological molecules
• Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings
• Reducing electron beam damage through alternative STEM scanning\n strategies. Part I -- Experimental findings