Scanned Probe Microscopy of Electronic Transport in Carbon Nanotubes

2000/02/14 by Adrian Bachtold, A. Bachtold, M. S. Fuhrer +9 · 9 citations
Materials Science · Physics and Astronomy · #Carbon Nanotubes in Composites #Force Microscopy Techniques and Applications #Mechanical and Optical Resonators #cond-mat.mes-hall #cond-mat.mtrl-sci

paper · pdf · doi:10.1103/physrevlett.84.6082

4 pages

arxiv created 2000/02/14 · openalex publication_date 2000/06/26 · arxiv updated 2009/11/30 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Abstract

We use electrostatic force microscopy and scanned gate microscopy to probe the conducting properties of carbon nanotubes at room temperature. Multiwalled carbon nanotubes are shown to be diffusive conductors, while metallic single-walled carbon nanotubes are ballistic conductors over micron lengths. Semiconducting single-walled carbon nanotubes are shown to have a series of large barriers to conduction along their length. These measurements are also used to probe the contact resistance and locate breaks in carbon nanotube circuits.

Citations

• Berry's Phase and Absence of Back Scattering in Carbon Nanotubes

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