Rotational disorder in few-layer graphene films on6H−SiC(000−1): A scanning tunneling microscopy study

2008/01/08 by F. Varchon, François Varchon, Pierre Mallet +3 · 1 citation
Materials Science · Physics and Astronomy · #Carbon Nanotubes in Composites #Graphene research and applications #Topological Materials and Phenomena #cond-mat.mtrl-sci

paper · pdf · doi:10.1103/physrevb.77.165415

published as Physical Review B 77 (2008) 165415 · 20 pages

arxiv created 2008/01/08 · openalex publication_date 2008/04/11 · arxiv updated 2009/12/01 · openalex created_date 2016/06/24 · openalex updated_date 2026/07/28

Abstract

We have analyzed by using scanning tunneling microscopy (STM) thin films made of few (three to five) graphene layers grown on the C terminated face of 6H\text\ensuremath-SiC in order to identify the nature of the azimuthal disorder reported in this material. We observe superstructures which are interpreted as Moir'e patterns due to a misorientation angle between consecutive layers. The presence of stacking faults is expected to lead to electronic properties reminiscent of single layer graphene even for multilayer samples. Our results indicate that this apparent electronic decoupling of the layers can show up in STM data.

Citations

• Ultrathin Epitaxial Graphite: 2D Electron Gas Properties and a Route toward Graphene-based Nanoelectronics
• Two-dimensional atomic crystals

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• Pentacene on Ni(111): room-temperature molecular packing and temperature-activated conversion to graphene
• From local to collective superconductivity in proximitized graphene

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