Anisotropy of Resonant Inelastic X-Ray Scattering at the K Edge of Si:Theoretical Analysis

2004/05/31 by Yunori Nisikawa, Manabu Usuda, Jun-ichi Igarashi · 1 citation
Physics and Astronomy · #cond-mat.mtrl-sci

paper · pdf · doi:10.1143/jpsj.73.3171

published as J. Phys. Soc. Jpn. 73, 3171-3176(2004) · 18 pages, 11 figures

arxiv created 2006/04/18 · arxiv updated 2009/12/01

Abstract

We investigate theoretically the resonant inelastic x-ray scattering (RIXS) at the K edge of Si on the basis of an ab initio calculation. We calculate the RIXS spectra with systematically varying transfered-momenta, incident-photon energy and incident-photon polarization. We confirm the anisotropy of the experimental spectra by Y. Ma \it et al. (Phys. Rev. Lett. 74, 478 (1995)), providing a quantitative explanation of the spectra.

Cited by

• Momentum-dependent resonant inelastic X-ray scattering at the Si K edge of 3C-SiC: A theoretical study on a relation between spectra and valence band dispersion