2025/04/03 by W. Riegler, Riegler, Werner
Engineering · Physics and Astronomy · #Advanced MEMS and NEMS Technologies #FOS: Physical sciences #High Energy Physics - Experiment (hep-ex) #Instrumentation and Detectors (physics.ins-det) #Mechanical and Optical Resonators #Photonic and Optical Devices
paper · pdf · doi:10.48550/arxiv.2504.02570
openalex publication_date 2025/04/03 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
In this report, we derive analytical expressions for the time resolution limits of standard silicon sensors, LGADs, and 3D trench sensors. We separately examine the effects of Landau fluctuations and electronic noise. To analyze Landau fluctuations, we relate the time resolution of a single electron-hole pair generated at a random position in the sensor to the time resolution associated with the full ionization pattern produced by a charged particle. For electronic noise, we explore optimal filtering techniques that minimize its impact on time resolution, and evaluate how closely these can be approximated by practical filters. Finally, we demonstrate that the combined effect of Landau fluctuations and electronic noise cannot, in general, be simply expressed as the quadratic sum of the individual contributions.