2024/05/13 by Margherita Taddei, Daniel J. Graham · 1 voice
Engineering · Materials Science · #Conducting polymers and applications #Perovskite Materials and Applications #Solid-state spectroscopy and crystallography
paper · doi:10.1116/6.0003624
openalex publication_date 2024/05/13 · openalex created_date 2025/10/10 · openalex updated_date 2026/08/01
We report positive and negative ion time-of-flight secondary ion mass spectrometry (ToF-SIMS) spectra of metal-halide perovskite (MHP) films used for photovoltaic applications. This ToF-SIMS spectral library is of importance because it identifies the major peaks in most MHP films from organic [formamidinium (FA+)] and inorganic (Cs+) cations and anions (I− and Br−).