2025/12/01 by James P. Novak, Tianhao Hu, Tharanga Nanayakkara +2 · 1 voice
Materials Science · Physics and Astronomy · #Electron and X-Ray Spectroscopy Techniques #Semiconductor materials and interfaces #Surface and Thin Film Phenomena
paper · doi:10.1116/6.0005008
openalex publication_date 2025/12/01 · openalex created_date 2025/12/05 · openalex updated_date 2026/08/01
Platinum silicide has garnered increased attention due to its potential applications as a superconductor within silicon technology. In this work, we characterize a superconducting PtSi film using x-ray photoelectron spectroscopy with an Al Kα excitation source. Survey spectra, Pt 5s, Pt 4f, Pt 4d, Pt 4p, Pt 4s, Si 2p, Si 2s, O 1s core levels, and the valence band spectrum were measured. This collection of high-quality core level spectra of a superconducting PtSi film provide reference data for this material, which often has a minimal native silicon oxide layer and overlapping Si and Pt core level peaks.