Direct Analysis of Stacked Au/Ti/In2O3/Al2O3/p+-Si Transport Mechanisms Using Operando Hard X-ray Photoelectron Spectroscopy

2025/05/14 by Ibrahima Gueye, Shigenori Ueda, Atsushi Ogura +1
#Al2O3 #Band bending #Chemical-structures #HAXPES #In2O3 #Interfaces #Operando

paper · doi:10.48505/nims.4829

Abstract

ACS Applied Electronic Materials. 6 [5] (2024)3237-3248

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