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Design Study of a 200 KeV Scanning Proton Microprobe Using a Field Ionization Source

1976/01/01 by M. Singh, Mahesh Chand Singh, J. Melvin +2
Engineering · Materials Science · Physics and Astronomy · #Electron and X-Ray Spectroscopy Techniques #Nuclear Physics and Applications #Particle accelerators and beam dynamics

paper · doi:10.1109/tns.1976.4328323

crossref issued 1976/01/01 · crossref published 1976/01/01 · crossref published-print 1976/01/01 · openalex publication_date 1976/01/01 · crossref created 2008/07/22 · crossref deposited 2021/11/29 · openalex created_date 2025/10/10 · crossref indexed 2026/07/28 · openalex updated_date 2026/07/29

Abstract

A preliminary design study has been conducted for constructing a 200 KeV scanning proton microprobe which utilizes the phenomenon of field ionization in hydrogen gas to create a proton source of extremely small dimensions and high "brightness." Calculations for the focusing action of a non-uniformly graded accelerating column, in conjunction with a superconducting magnetic solenoid indicate a final beam-spot size better than 50 Å. The ultimate aim is to construct a high energy proton or heavy-ion microprobe which will rival or even excel the field emission scanning electron microscopes presently in use. Justification for using high energy protons (or heavy-ions) as probe particles instead of electrons has been presented in this paper, along with details of the beam transport and focusing system.

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