2003/11/10 by K. R. Brown, L. Sun, B. E. Kane
Physics and Astronomy · #Force Microscopy Techniques and Applications #Mechanical and Optical Resonators #Surface and Thin Film Phenomena #cond-mat.mes-hall
paper · pdf · doi:10.1063/1.1753104
published as Rev. Sci. Instrum. 75, 2029 (2004) · 5 pages, 5 figures, submitted to RSI
arxiv created 2003/11/10 · openalex publication_date 2004/05/21 · arxiv updated 2009/12/01 · openalex created_date 2016/06/24 · openalex updated_date 2026/07/28
We demonstrate a scanning force microscope, based upon a quartz tuning fork, that operates below 100 mK and in magnetic fields up to 6 T. The microscope has a conducting tip for electrical probing of nanostructures of interest, and it incorporates a low noise cryogenic amplifier to measure both the vibrations of the tuning fork and the electrical signals from the nanostructures. At millikelvin temperatures, the imaging resolution is below 1 μm in a 22 μm×22 μm range, and a coarse motion provides translations of a few mm. This scanned probe is useful for high bandwidth measurement of many high impedance nanostructures on a single sample. We show data locating a single electron transistor within an array and measure its Coulomb blockade with a sensitivity of 2.6×10−5 e/Hz.