2006/04/18 by Yongho Seo, Seo, Yongho, Paul Cadden-Zimansky +3
Engineering · Physics and Astronomy · #FOS: Physical sciences #Force Microscopy Techniques and Applications #Integrated Circuits and Semiconductor Failure Analysis #Mesoscale and Nanoscale Physics (cond-mat.mes-hall) #Near-Field Optical Microscopy #cond-mat.mes-hall
paper · pdf · doi:10.48550/arxiv.cond-mat/0604407
6 pages, 8 figures
arxiv created 2006/04/18 · openalex publication_date 2006/04/18 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
We have developed a low-temperature scanning probe microscope using a quartz tuning fork operating at 4.2 K. A silicon tip from a commercial cantilever was attached to one prong of the tuning fork. With a metallic coating, a potential could be applied to the tip to sense the charge distribution in a sample, while with a magnetically coated tip, magnetic force imaging could be performed. For the coarse approach mechanism, we developed a reliable low-temperature walker with low material cost and simple machining. We have obtained Coulomb force images of boron nanowires at room temperature and magnetic nano-structures at low temperature. For lift-mode scanning, we employed a frequency detection mode for the first topographic scan and phase detection mode for the second lift scan.