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Finite-temperature resistive transition in the two-dimensionalXYgauge glass model

2000/04/05 by Beom Jun Kim · 1 citation
Physics and Astronomy · #Advanced Condensed Matter Physics #Physics of Superconductivity and Magnetism #Theoretical and Computational Physics #cond-mat.supr-con

paper · pdf · doi:10.1103/physrevb.62.644

published as Phys. Rev. B 62, 644 (2000) · 5 pages in two columns, 4 eps figures included, to appear in PRB

arxiv created 2000/04/05 · openalex publication_date 2000/07/01 · arxiv updated 2009/11/30 · openalex created_date 2016/06/24 · openalex updated_date 2026/07/28

Abstract

We investigate numerically the resistive transition in the two-dimensional XY gauge glass model. The resistively shunted junction dynamics subject to the fluctuating twist boundary condition is used and the linear resistances in the absence of an external current at various system sizes are computed. Through the use of the standard finite-size scaling method, the finite temperature resistive transition is found at kBTc=0.22(2) (in units of the Josephson coupling strength) with dynamic critical exponent z=2.0(1) and the static exponent \ensuremathν=1.2(2), in contrast to widely believed expectation of the zero-temperature transition. Comparisons with existing experiments and simulations are also made.

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