Ultra-high contrast STEM imaging for segmented/pixelated detectors by maximizing the signal-to-noise ratio

2020/10/16 by Kousuke Ooe, Takehito Seki, Yuichi Ikuhara +1 · 4 citations
Biochemistry, Genetics and Molecular Biology · Engineering · Physics and Astronomy · #Advanced Electron Microscopy Techniques and Applications #Advanced X-ray Imaging Techniques #Advanced X-ray and CT Imaging

paper · doi:10.1016/j.ultramic.2020.113133

openalex publication_date 2020/10/16 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Citations

• Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution
• Enhanced phase contrast transfer using ptychography combined with a pre-specimen phase plate in a scanning transmission electron microscope
• High dose efficiency atomic resolution imaging via electron ptychography

Cited by

• Guided progressive reconstructive imaging: a new quantization-based framework for low-dose, high-throughput and real-time analytical ptychography
• Direct observation of cation-dependent polarisation switching dynamics in fluorite ferroelectrics
• Beyond Contrast Transfer: Spectral SNR as a Dose-Aware Metric for STEM Phase Retrieval
• Commonsense and common nonsense opinions: PROSPECTS for further reducing beam damage in electron microscopy of radiation-sensitive specimens