High dose efficiency atomic resolution imaging via electron ptychography

2018/10/18 by Timothy J. Pennycook, Gerardo T. Martinez, Gerardo Martínez +2 · 5 citations
Biochemistry, Genetics and Molecular Biology · Physics and Astronomy · #Advanced Electron Microscopy Techniques and Applications #Advanced X-ray Imaging Techniques #Laser-Plasma Interactions and Diagnostics

paper · pdf · doi:10.1016/j.ultramic.2018.10.005

openalex publication_date 2018/10/18 · openalex created_date 2025/10/10 · openalex updated_date 2026/08/01

Abstract

Radiation damage places a fundamental limitation on the ability of microscopy to resolve many types of materials at high resolution. Here we evaluate the dose efficiency of phase contrast imaging with electron ptychography. The method is found to be far more resilient to temporal incoherence than conventional and spherical aberration optimized phase contrast imaging, resulting in significantly greater clarity at a given dose. This robustness is explained by the presence of achromatic lines in the four dimensional ptychographic dataset.

Citations

• Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution
• The potential and limitations of neutrons, electrons and X-rays for atomic resolution microscopy of unstained biological molecules
• Enhanced phase contrast transfer using ptychography combined with a pre-specimen phase plate in a scanning transmission electron microscope

Cited by

• Guided progressive reconstructive imaging: a new quantization-based framework for low-dose, high-throughput and real-time analytical ptychography
• Advanced structural characterization of single-walled carbon nanotubes with 4D-STEM
• Using Aberrations to Improve Dose-Efficient Tilt-corrected 4D-STEM Imaging
• Beyond Contrast Transfer: Spectral SNR as a Dose-Aware Metric for STEM Phase Retrieval
• Ultra-high contrast STEM imaging for segmented/pixelated detectors by maximizing the signal-to-noise ratio