Absorption and dispersion of low-loss dielectrics measured with microwave transient radiation

1989/04/13 by Y. Pastol, G. Arjavalingam, J.-M. Halbout +1
Engineering · Physics and Astronomy · #Absorption (acoustics) #Advanced Photonic Communication Systems #Composite material #Dielectric #Dielectric loss #Dispersion (optics) #Engineering #Gyrotron and Vacuum Electronics Research #Materials science #Microwave #Optics #Optoelectronics #Physics #Picosecond #Pulsed Power Technology Applications #Radiation #Telecommunications #Transient (computer programming)

paper · doi:10.1049/el:19890358

openalex publication_date 1989/04/13 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/23

Abstract

Measurements of the frequency-dependent loss and dispersion of low-loss dielectrics, between 10 and 130 GHz, are presented. The data are obtained from a single experiment using the picosecond transient radiation from optoelectronically pulsed integrated antennas.

Related

• Microwave Dielectric Loss at Single Photon Energies and milliKelvin Temperatures
• Microwave Technologies-- Determination of Magnetic and Dielectric Materials Microwave Properties
• An indirect correlation of dielectric properties using optical trapping and dielectric resonance in two different frequency regimes
• Measuring Dielectric Properties and Surface Resistance of Microwave PCBs in the K-band
• Low-Dispersive Permittivity Measurement Based on Transmitted Power Only