2008/02/18 by Aaron D. O’Connell, Aaron D. O'Connell, M. Ansmann +10 · 3 citations
Computer Science · Physics and Astronomy · #Advanced Frequency and Time Standards #Amorphous solid #Dielectric #Dielectric loss #Dissipation #Dissipation factor #Excitation #Microwave #Quantum Information and Cryptography #Quantum optics and atomic interactions #Resonator #cond-mat.supr-con
paper · pdf · doi:10.1063/1.2898887
4 pages, 3 figures, submitted to Applied Physics Letters
arxiv created 2008/02/18 · openalex publication_date 2008/03/17 · arxiv updated 2009/12/01 · openalex created_date 2016/06/24 · openalex updated_date 2026/08/05
The microwave performance of amorphous dielectric materials at very low temperatures and very low excitation strengths displays significant excess loss. Here, we present the loss tangents of some common amorphous and crystalline dielectrics, measured at low temperatures (T<100mK) with near single-photon excitation energies, E∕ℏω0∼1, using both coplanar waveguide and lumped LC resonators. The loss can be understood using a two-level state defect model. A circuit analysis of the half-wavelength resonators we used is outlined, and the energy dissipation of such a resonator on a multilayered dielectric substrate is theoretically considered.