2009/09/16 by Daniel NiewieczerzaŁ, Niewieczerzal, Daniel, Czesław Oleksy +3
Engineering · Physics and Astronomy · #Advanced Materials Characterization Techniques #FOS: Physical sciences #Force Microscopy Techniques and Applications #Ion-surface interactions and analysis #Materials Science (cond-mat.mtrl-sci) #Mesoscale and Nanoscale Physics (cond-mat.mes-hall)
paper · pdf · doi:10.48550/arxiv.0909.3049
openalex publication_date 2009/09/16 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
We perform detailed numerical simulations of field ion microscopy images of faceted crystals and compare them with experimental observations. In contrast to the case of crystals with a smooth surface, for a faceted topography we find extreme deformations of the ion image. Local magnification is highly inhomogeneous and may vary by an order of magnitude: from 0.64 to 6.7. Moreover, the anisotropy of the magnification at a point located on the facet edge may reach a factor of 10.