1997/12/11 by Franz-Josef Elmer, Franz‐Josef Elmer, Elmer, Franz-Josef
Engineering · Physics and Astronomy · #Adhesion, Friction, and Surface Interactions #FOS: Physical sciences #Force Microscopy Techniques and Applications #Materials Science (cond-mat.mtrl-sci) #Mechanical and Optical Resonators #cond-mat.mtrl-sci
paper · pdf · doi:10.48550/arxiv.cond-mat/9712120
Written in REVTeX, 4 pages, 4 Postscript figures
arxiv created 1997/12/11 · openalex publication_date 1997/12/11 · arxiv updated 2009/11/30 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
We propose a new method to investigate interactions involved in atomic force microscopy (AFM). It is a dynamical method relying on the growth of oscillations via parametric resonance. With this method the second and third derivatives of the tip-surface interaction potential can be measured simultaneously. Because of its threshold behavior parametric resonance AFM leads to sharp contrasts in surface imaging.