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Response times of two-dimensional photodetectors limited by intrinsic resistance and capacitance

2025/12/12 by Safonov, Ilya, Svintsov, Dmitry · 1 citation
Materials Science · Physics and Astronomy · Engineering · #2D Materials and Applications #Topological Materials and Phenomena #Nanowire Synthesis and Applications

paper · doi:10.48550/arxiv.2512.11497

Abstract

Most contemporary architectures of photodetectors based on two-dimensional materials include global gates for carrier density control and local p-n junctions in the channel. We study the dependence of photocurrent in such detectors on the light modulation frequency, fully taking into account the effects of distributed resistance and gate-channel capacitance. The decay of photocurrent with modulation frequency governs the response time. We find that the maximum modulation frequency is largely determined by the position of light-sensitive junction with respect to the middle of the channel. Largest modulation frequency is achieved for junctions in immediate vicinity of either source or drain contacts, while fast roll-off of the modulation characteristic is observed for junction in the middle of the channel.

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