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Two-level System Loss: significant not only at Millikelvin

2024/07/11 by Wenelei Shan, Shan, Wenelei, Shohei Ezaki +1
Engineering · #FOS: Physical sciences #Instrumentation and Methods for Astrophysics (astro-ph.IM) #Materials science #Nuclear reactor physics and engineering #Physics

paper · pdf · doi:10.48550/arxiv.2407.08157

published in arXiv (Cornell University) (Cornell University)

openalex publication_date 2024/07/11 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Abstract

Tow-level system (TLS) loss in amorphous dielectric materials has been intensively studied at millikelvin temperatures due to its impact on superconducting qubit devices and incoherent detectors. However, the significance of TLS loss in superconducting transmission lines at liquid helium temperatures remains unclear. This study investigates TLS loss in amorphous SiO2 at liquid helium temperatures (about 4 K) within a frequency range of 130-170 GHz, using niobium microstrip and coplanar waveguide resonators. Our results demonstrate notable power and temperature dependence of dielectric loss, with the dielectric loss and quasiparticle loss exchanging dominance at around 4 K. These findings are consistent with TLS models and provide crucial insights for the design of superconducting devices operating at liquid helium temperatures.

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