2024/12/16 by Bogroff, Malcolm, Cowley, Gabriel, Nicastro, Ariel +9
#FOS: Physical sciences #Mesoscale and Nanoscale Physics (cond-mat.mes-hall) #Optics (physics.optics)
paper · doi:10.48550/arxiv.2412.11413
Cathodoluminescence microscopy is now a well-established and powerful tool for probing the photonic properties of nanoscale materials, but in many cases, nanophotonic materials are easily damaged by the electron-beam doses necessary to achieve reasonable cathodoluminescence signal-to-noise ratios. Two-dimensional materials have proven particularly susceptible to beam-induced modifications, yielding both obstacles to high spatial-resolution measurement and opportunities for beam-induced patterning of quantum photonic systems. Here pan-sharpening techniques are applied to cathodoluminescence microscopy in order to address these challenges and experimentally demonstrate the promise of pan-sharpening for minimally-perturbative high-spatial-resolution spectrum imaging of beam-sensitive materials.