Integrated Circuit Readout for the Silicon Sensor Test Station

2009/06/11 by E. Atkin, Atkin, E., A. Kluev +13
Computer Science · Engineering · Physics and Astronomy · #CCD and CMOS Imaging Sensors #FOS: Physical sciences #Instrumentation and Detectors (physics.ins-det) #Particle Detector Development and Performance #Sensor Technology and Measurement Systems #physics.ins-det

paper · pdf · doi:10.48550/arxiv.0906.2063

6 pages, 5 figures

arxiv created 2009/06/11 · openalex publication_date 2009/06/11 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Abstract

Various chips for the silicon sensors measurements are described. These chips are based on 0.35 um and 0.18um CMOS technology. Several analog chips together with self-trigger /derandomizer one allow to measure silicon sensors designed for different purposes. Tracking systems, calorimeters, particle charge measurement system and other application sensors can be investigated by the integrated circuit readout with laser or radioactive sources. Also electrical parameters of silicon sensors can be studied by such test setup.

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