2016/04/12 by Bhupesh Bishnoi, Bishnoi, Bhupesh, Bahniman Ghosh +1
Engineering · Physics and Astronomy · #Advancements in Semiconductor Devices and Circuit Design #FOS: Physical sciences #Mesoscale and Nanoscale Physics (cond-mat.mes-hall) #Quantum and electron transport phenomena #Semiconductor materials and devices
paper · pdf · doi:10.48550/arxiv.1604.03283
openalex publication_date 2016/04/12 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
We investigate spin polarized electron transport in ultra-thin Si-Core/Ge-Shell and Ge-Core/Si-Shell nanowire system using semi-classical Monte Carlo simulation method. Depolarization of electron's spin occurs in nanowire mainly due to D'yakonov-Perel dephasing (DP-mechanism) and Elliott-Yafet dephasing (EY-mechanism). We studied the dependence of spin dephasing on ultra-thin silicon core diameter in Si-Core/Ge-Shell nanowire and germanium core diameter in Ge-Core/Si-Shell nanowire. Variation in spin dephasing length with varying core diameter ranging from 1 nm to 9 nm indicate that spin dephasing length increases with increase in Si-core diameter in Si-Core/Ge-Shell nanowire and spin dephasing length decreases with increase in Ge-core diameter in Ge-Core/Si-Shell nanowire. We then studied the variation in spin dephasing length with varying externally applied transverse electric field ranging from 20 kV/cm to100 kV/cm. In the electric field dependence study we found that spin dephasing length is weakly dependent upon applied electric field. In the end, we studied the variation in spin dephasing length with varying temperature in the range of 4 K to 377 K. In this simulational study we found that for both Si-Core/Ge-Shell and Ge-Core/Si-Shell nanowire system spin dephasing length shows a strong dependence on temperature and spin dephasing length increases with decrease in temperature from room temperature range.