2019/04/24 by Koppell, Stewart A., Mankos, Marian, Bowman, Adam J. +4 · 1 citation
#Applied Physics (physics.app-ph) #FOS: Physical sciences
paper · doi:10.48550/arxiv.1904.11064
Multi-pass transmission electron microscopy (MPTEM) has been proposed as a way to reduce damage to radiation-sensitive materials. For the field of cryo-electron microscopy (cryo-EM), this would significantly reduce the number of projections needed to create a 3D model and would allow the imaging of lower-contrast, more heterogeneous samples. We have designed a 10 keV proof-of-concept MPTEM. The column features fast-switching gated electron mirrors which cause each electron to interrogate the sample multiple times. A linear approximation for the multi-pass contrast transfer function (CTF) is developed to explain how the resolution depends on the number of passes through the sample.