2018/06/12 by Nan Jiang, Jiang, Nan
Biochemistry, Genetics and Molecular Biology · Materials Science · Physics and Astronomy · #Advanced Electron Microscopy Techniques and Applications #Electron and X-Ray Spectroscopy Techniques #Force Microscopy Techniques and Applications #cond-mat.mes-hall
paper · pdf · doi:10.48550/arxiv.1806.04789
arxiv created 2018/06/12 · arxiv updated 2018/06/14
A tool for manipulation of specific nanoparticles is essential for nanofabrication. This paper describes a new class of nanoscale techniques for manipulating individual nanoparticles on an insulating substrate using a focused electron beam. The controlled displacement of 20 nm Au nanoparticles is demonstrated, along with the extension to other systems, by exploiting the fundamental principles of particle motion under intense electron irradiation, which we elucidate. Excitation and ionization by the focused electron beam within the substrate are shown to produce an electric field on the particle in this new mechanism. The strength and direction of the electric field, and thus the motion of the nanoparticle, can be precisely controlled by the current density, exposure time and position of the electron beam.