1994/05/13 by Q. Niu, M. C. Chang, Niu, Q. +5
Engineering · Materials Science · Physics and Astronomy · #Advanced Materials Characterization Techniques #Condensed Matter (cond-mat) #Electron and X-Ray Spectroscopy Techniques #FOS: Physical sciences #Surface and Thin Film Phenomena #cond-mat
paper · pdf · doi:10.48550/arxiv.cond-mat/9405036
Minor changes, to appear in Phys.Rev.B, 12 pages + 2 figures
openalex publication_date 1994/05/13 · arxiv created 1994/12/26 · arxiv updated 2009/11/30 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
We explore the possibility of using a double-tip STM to probe the single electron Green function of a sample surface, and describe a few important applications: (1) Probing constant energy surfaces in \k-space by ballistic transport; (2) Measuring scattering phase shifts of defects; (3) Observing the transition from ballistic to diffusive transport to localization; and (4) Measuring inelastic mean free paths.