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Local contact stress measurements at a rough interface

2007/11/07 by J. Scheibert, Julien Scheibert, Scheibert, J. +12
Engineering · Mathematics · Physics and Astronomy · #Adhesion, Friction, and Surface Interactions #Advanced Fiber Optic Sensors #Boundary (topology) #Boundary value problem #Composite material #Contact area #Contact mechanics #Coulomb #Engineering #FOS: Physical sciences #Finite element method #Gear and Bearing Dynamics Analysis #Materials science #Mathematical analysis #Mathematics #Mechanics #Physics #Population #Soft Condensed Matter (cond-mat.soft) #Stress (linguistics) #Structural engineering #cond-mat.soft

paper · pdf · doi:10.48550/arxiv.0711.1117

published in arXiv (Cornell University) (Cornell University) · 4 pages, 5 figures

arxiv created 2007/11/07 · openalex publication_date 2007/11/07 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/08/05

Abstract

An original MEMS-based force sensing device is designed which allows to measure spatially resolved normal and tangential stress fields at the base of an elastomeric film. This device is used for the study of the contact stress between a rough film and a smooth glass sphere under normal load. The measured profiles are compared to Finite Elements Method calculations for a smooth contact with boundary conditions obeying Amontons-Coulomb's friction law. The accuracy of the measurements allows to discriminate between dry and lubricated contact conditions and to evidence load-dependent deviations from Amontons-Coulomb's profiles. These deviations are qualitatively interpreted by taking into account the finite compliance of the micro-contact population.

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