On Delay Faults Affecting I/O Blocks of an SRAM-Based FPGA Due to Ionizing Radiations

2014/09/02 by Fatima Zahra Tazi, Claude Thibeault, Tazi, Fatima Zahra +7
Computer Science · Engineering · Physics and Astronomy · #FOS: Computer and information sciences #FOS: Physical sciences #Hardware Architecture (cs.AR) #Physical Unclonable Functions (PUFs) and Hardware Security #Popular Physics (physics.pop-ph) #Radiation Effects in Electronics #Space Physics (physics.space-ph) #VLSI and Analog Circuit Testing #cs.AR #physics.pop-ph #physics.space-ph

paper · pdf · doi:10.48550/arxiv.1409.0736

arxiv created 2014/09/02 · openalex publication_date 2014/09/02 · arxiv updated 2014/09/03 · openalex created_date 2022/08/29 · openalex updated_date 2026/07/28

Abstract

Experimental means to characterize delay faults induced by bit flips and SEUs in I/O blocks of SRAM-based FPGAs are proposed. A delay fault up to 6.2ns sensitized by an events chain is reported.

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