Pixel response characterization of the ARCADIA Fully Depleted MAPS

2025/12/17 by Pantouvakis, C., Rignanese, M., Zenger, T. +24
Engineering · Physics and Astronomy · #CCD and CMOS Imaging Sensors #FOS: Physical sciences #Instrumentation and Detectors (physics.ins-det) #Particle Detector Development and Performance #Radiation Detection and Scintillator Technologies

paper · doi:10.48550/arxiv.2512.15289

openalex publication_date 2025/12/17 · openalex created_date 2025/12/19 · openalex updated_date 2026/07/28

Abstract

Monolithic Active Pixel Sensors (MAPS) achieved widespread use in several scientific applications, thanks to their properties, such as low material budget and high granularity. The ARCADIA INFN project developed a Fully-Depleted MAPS (FD-MAPS), using a modified LFoundry 110 nm CIS process. This work presents the first laboratory characterization of the ARCADIA MD3 prototype. Measurements include threshold uniformity studies using both test-pulse injection and a ⁵⁵Fe source, as well as threshold and noise calibration achieved thanks to monochromatic X-ray sources. Ultimately, charge-collection efficiency is evaluated using an infrared laser setup.

Citations

• Further Characterisation of Digital Pixel Test Structures Implemented in a 65 nm CMOS Process
• Charge calibration of MALTA2, a radiation hard depleted monolithic active pixel sensor
• Characterisation of analogue Monolithic Active Pixel Sensor test structures implemented in a 65 nm CMOS imaging process

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