Michael Stückelberger
- Complex Refractive Index Spectra of CH3NH3PbI3 Perovskite Thin Films Determined by Spectroscopic Ellipsometry and Spectrophotometry
2014/12/10 by Philipp Löper, Michael Stückelberger, Bjoern Niesen +7 · 4 citations
Engineering · Materials Science · #Perovskite Materials and Applications #Solid-state spectroscopy and crystallography #Chalcogenide Semiconductor Thin Films