J. A. Porto
- Resonance shift effects in apertureless scanning near-field optical microscopy
2002/08/26 by J. A. Porto, Peter Johansson, P. Johansson +4 · 2 citations
Engineering · Physics and Astronomy · #Integrated Circuits and Semiconductor Failure Analysis #Near-Field Optical Microscopy #Surface and Thin Film Phenomena #cond-mat