Aibin Yan

1. Information Assurance Through Redundant Design: A Novel TNU Error-Resilient Latch for Harsh Radiation Environment
   2020/01/15 by Aibin Yan, Yuanjie Hu, Jie Cui +5 · 1 citation
   Engineering · Computer Science · #Radiation Effects in Electronics #VLSI and Analog Circuit Testing #Semiconductor materials and devices