Shaoliang Yang

1. Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection
   2026/07/19 by Shaoliang Yang, Jun Wang
   #cs.CV
2. When a positive SIMP density floor is not enough: solver admissibility and guarded floor selection in matrix-free 3D topology optimization
   2026/07/29 by Shaoliang Yang, Jun Wang, Yunsheng Wang
   Computer Science · Mathematics · #cs.CE #cs.NA #math.NA