Wai Keung Wong

1. MVREC: A General Few-shot Defect Classification Model Using Multi-View Region-Context
   2024/12/22 by Shuai Lyu, Rongchen Zhang, Lyu, Shuai +9 · 2 citations
   Engineering · #Advanced X-ray and CT Imaging #Artificial Intelligence (cs.AI) #Computer Vision and Pattern Recognition (cs.CV) #FOS: Computer and information sciences #Industrial Vision Systems and Defect Detection #Welding Techniques and Residual Stresses
2. Deep Learning Regularized Fisher Mappings
   2011/09/12 by W. K. Wong, Wai Keung Wong, Mingming Sun · 1 citation
   Computer Science · #Domain Adaptation and Few-Shot Learning #Face and Expression Recognition #Machine Learning and ELM