Víctor Blanco
- Fairness in Maximal Covering Location Problems
2022/04/13 by Víctor Blanco, Ricardo Gázquez, Blanco, Víctor +1 · 2 citations
Business, Management and Accounting · Engineering · #90B80 #90B85 #90C11 #90C59 #FOS: Mathematics #Facility Location and Emergency Management #Optimization and Control (math.OC) #Vehicle Routing Optimization Methods
- Addressing Class Imbalance and Data Limitations in Advanced Node Semiconductor Defect Inspection: A Generative Approach for SEM Images
2024/07/14 by Bappaditya Dey, Dey, Bappaditya, Vic De Ridder +7 · 2 citations
Engineering · #Industrial Vision Systems and Defect Detection #Integrated Circuits and Semiconductor Failure Analysis #Advancements in Photolithography Techniques
- Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy
2023/11/19 by Vic De Ridder, De Ridder, Vic, Bappaditya Dey +7 · 1 citation
Engineering · #Advancements in Photolithography Techniques #Integrated Circuits and Semiconductor Failure Analysis #Industrial Vision Systems and Defect Detection
- Optimization of Kinetic--Stoichiometric Growth Bounds over Autocatalytic Subnetworks
2026/07/25 by Víctor Blanco, Gabriel González
#math.OC