Keum, Seongho
- Pathology Foundation Models are Scanner Sensitive: Benchmark and Mitigation with Contrastive ScanGen Loss
2025/07/29 by Carloni, Gianluca, Brattoli, Biagio, Keum, Seongho +4 · 2 citations
#Artificial Intelligence (cs.AI) #Computer Vision and Pattern Recognition (cs.CV) #FOS: Biological sciences #FOS: Computer and information sciences #FOS: Electrical engineering #I.2 #I.2.6 #I.4 #I.4.7 #I.5 #Image and Video Processing (eess.IV) #J.3 #J.6 #Quantitative Methods (q-bio.QM) #Tissues and Organs (q-bio.TO) #electronic engineering #information engineering
- Slot-Mixup with Subsampling: A Simple Regularization for WSI Classification
2023/11/29 by Keum, Seongho, Kim, Sanghyun, Lee, Soojeong +1 · 1 citation
#Artificial Intelligence (cs.AI) #Computer Vision and Pattern Recognition (cs.CV) #FOS: Computer and information sciences #Machine Learning (cs.LG)