Nicholas W. M. Ritchie

1. Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS)
   2014/11/11 by Dale E. Newbury, Nicholas W. M. Ritchie · 26 citations
   Materials Science · Physics and Astronomy · #Electron and X-Ray Spectroscopy Techniques #X-ray Spectroscopy and Fluorescence Analysis #Surface and Thin Film Phenomena