Jeon, Minjun

1. Robustness of electron charge shuttling: Architectures, pulses, charge defects and noise thresholds
   2024/08/06 by Simon C. Benjamin, Jeon, Minjun, Benjamin, Simon C. +2 · 5 citations
   Engineering · #Advancements in Semiconductor Devices and Circuit Design #FOS: Physical sciences #Mesoscale and Nanoscale Physics (cond-mat.mes-hall) #Quantum Physics (quant-ph) #Radiation Effects in Electronics #Semiconductor materials and devices