Ng, Samuel S. H.

1. Simulating Charged Defects in Silicon Dangling Bond Logic Systems to Evaluate Logic Robustness
   2022/11/16 by Ng, Samuel S. H., Croshaw, Jeremiah, Walter, Marcel +3 · 1 citation
   #FOS: Physical sciences #Mesoscale and Nanoscale Physics (cond-mat.mes-hall)