Delaroche, Fabien

1. A model to predict image formation in the three-dimensional field ion\n microscope
   2019/11/19 by Benjamin Klaes, Klaes, Benjamin, R. Lardé +13 · 1 citation
   Engineering · Physics and Astronomy · #Advanced Materials Characterization Techniques #FOS: Physical sciences #Force Microscopy Techniques and Applications #Materials Science (cond-mat.mtrl-sci) #Surface and Thin Film Phenomena